CHRocodile sensors for wafer metrology
Semiconductor and microelectronic inspection sensors need to measure the gauge of wafers, determine structures in screen manufacturing, and check bonding during inline quality controls. Moreover, they also have to measure transparent coatings, and monitor mechanical and chemical removal processes in real time for quality control purposes.
With their lateral resolution in the micrometer range and high resolution in the sub-micrometer range, our CHRocodile sensors fulfill all these requirements and deliver reliable measurements in both harsh industrial and clean room environments.
As the demand for wafers with ever-lower total thickness variation (TTV) or defined structured surface is increasing, extremely accurate in-process thickness monitoring through non-contact, non-destructive measurement technology is becoming indispensable.
The challenges come from varying wafer thickness ranges, differing prime wafer materials, and the harsh inline process environment (e.g. no clear view of the wafer because of grinding sludge). Our CHRocodile 2 IT, IT DW series and 2 DPS sensors can reliably measure greatly varying wafer thicknesses and materials (Si doped, highly doped, SIC, GaN, InP, plastics, sapphire, LiTaO) and wafer processing states.
The water- and acid-resistant probes and water jet probes are unaffected by wear and tear and thus reduce operating costs. They are also suitable for customized integration into different process machines.
Precise monitoring and control of wafer thickness by optical measuring is described in our whitepaper "CMP and grinding in the semiconductor industry". Detailed information can be downloaded by filling out the form.
Too large wafer bow, warp or TTV pose a great challenge for wafer handling and processing and can even cause wafer breakage and significant production losses. Measurement of these values to minimize losses has to be not only highly accurate and fast but also non-destructive, i.e. non-contact. As bow and warp change at different production steps, metrology and process feedback are crucial.
Our non-contact optical measurement technology enables in-process deployment close to the production steps where bow and warp are caused. CHRocodile 2 IT and 2 DPS sensors offer flexible solutions, with compact chromatic probes, easy refitting, and measurement of all kinds of wafers.
Monitoring dicing groove depth and width during or after material treatment safeguards the required treatment quality. Visualizing the groove also reveals any die cracks, which may lead to die breakage and expensive output losses. Measurement of the groove depth and width enables the wafer to be reworked if there is any deviation from the norm.
To image the largest possible part of the groove and identify as many die cracks as possible, fast non-contact metrology with a high lateral resolution and great accuracy is required. The CHRocodile CLS is well-suited to measuring the depth and width of dicing grooves.
If only the width needs to be measured, our Chromatic Vision Camera (CVC) is a better option because of its high speed.
Both devices have outstanding imaging quality and do not suffer from shadowing as they measure at a perpendicular angle to the sample. Moreover, height measurements are extremely accurate, lateral resolution very high, and measurements possible on steep slopes.
Wafer level bumps and solder bumps are essential for electronic interconnections. Measuring their height and coplanarity safeguards interconnection quality. With bump spacing decreasing and bump density increasing, only coaxial imaging can measure topographies accurately and fast enough.
The CHRocodile CLS uses this technology for measurements of great accuracy and resolution. Moreover, coaxial imaging technology measures at a perpendicular angle to the sample and can thus measure the precise bump shape even at low spacing and on steep slopes.
Material treatment during dicing stresses a wafer and the silicon may crack. Visualizing dicing grooves detects such silicon cracks, which may cause die breakage during subsequent production. The thinner the wafer, the higher the risk of breakage, and the more important it is to detect these microscopic cracks.
The Chromatic Vision Camera (CVC) combines high resolution with a high depth of field to ensure sharp imaging without the need to autofocus. The line fast scanning speed of the CVC thus saves valuable time and increases throughput.
During photolithography µm-accurate alignment of the mask and wafer is essential. The smaller the structures, the more accurate the lateral and parallel alignment has to be. To meet these requirements, highly accurate, non-contact measurements are required.
The chromatic confocal and interferometric detectors in the CHRocodile 2 S meet these requirements and are also suitable for multiple leveling applications in the semiconductor industry. What's more, the sensors are maintenance-free and designed for non-stop operation in a production environment.
Die and wafer bonding is increasingly replacing traditional bonding techniques as it enables smaller bondings and IC packages, and also reduces the chip's energy consumption. However, highly accurate alignment of the dies or wafers is critical to secure IO connectivity.
Precitecs CHRocodile 2 S, CLS, 2 IT optical sensors and the Chromatic Vision Camera CVC measure the precise position, height, tilt, and rotation of the dies and enable exact wafer alignment during bonding. The great precision of chromatic confocal and interferometric sensors guarantees optimum bonding results.
Moreover, the speed of measurement allows in-process inspection which increases throughput, as does the ability to remove faulty bondings from the production process.
Probe cards are commonly used to conduct circuit tests on finished wafers. A probe card has numerous tiny tips that individually contact each die on the wafer and apply a test signal. The height uniformity and lateral position of the tips have to be regularly inspected to assure optimal wafer test results. With thousands of densely packed tips on each probe card, fast, coaxial and, above all, non-contact metrology is required.