
Full-field, non-contact optical mapping for wafer topography and bow control
This Photonics article highlights how advanced metrology is moving to the frontline of semiconductor manufacturing, enabling tighter process control at advanced nodes. It underscores the importance of high-precision, in-line measurement solutions-such as those from Precitec 3D Metrology-toensure yield, speed, and reliability in modern fabs. The full article can be read by clicking on this link.

Full-field, non-contact optical mapping for wafer topography and bow control