Pubblicazioni
![[Translate to Italienisch:] Enovasense sensor at work](/fileadmin/News/Enovasense_Sensor_1920x1280.jpg)
Precitec Acquires Majority Stake in Enovasense Thickness Sensor Company
Precitec Optronik has acquired a majority stake in the French start-up Enovasense with its technology to measure the thickness of all kinds of…
![[Translate to Italienisch:] I sistemi di saldatura laser sono molto innovativi](/fileadmin/News/Laser_Welding_solutions_for_Emobility_1920x1280.jpg)
Precitec vede un brillante futuro per i sistemi di saldatura laser
"In Precitec, l'innovazione è fondamentale", afferma Klaus Loeffler, amministratore delegato e direttore vendite di Precitec. Per ampliare la…

Qual è la correlazione tra potenza del laser e produttività?
Dr. Markus Kogel-Hollacher parla delle teste di taglio laser nella gamma di potenza di 30kW. La dipendenza quasi lineare della potenza e della…

Quali sono i vantaggi del taglio laser ad alta potenza?
Precitec è stata una delle aziende presenti all'Euroblech di Hannover, in Germania, a presentare teste di taglio per potenze laser estremamente…
![[Translate to Italienisch:] Nominees for Test and Measurement category](/fileadmin/News/Prism_Award_2023_1920x1280.jpg)
Precitec 3D Metrology è stata nominata per il premio SPIE Prism Award
SPIE announces finalists for 2023 Prism Awards
The annual awards celebrate the best of photonics innovation in areas such as biomedical devices,…

Are there any applications for which AI is not interesting?
Joachim Schwarz talks in Laser World Of Photonics about the technological potential of AI for laser-based production and quality monitoring and how…

Hand in hand for customised solutions
Article in Glass WorldWide April 2021
Precitec’s optical measuring technology is used throughout manufacturing industry for quality inspection and…

Non-contact thickness measurement of non-transparent components
Publication in the German Magazine InVision in April 2020
With the CHRocodile 2 DPS dual-channel sensor Precitec Optronik offers a stand-alone…

In-Process Wafer Step Height Measurement
Non-contact and non-destructive optical measuring in the nanometer range
During the grinding process the wafer thickness needs to be controlled in…