Our Products

Enovasense Field Sensor - detects defects below the surface

Enovasense Field Sensor HR product picture
  • Detects defects in and under coatings
  • Simultaneously creates a mapping of the coating thickness
  • Non-destructive

     

     

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Flying Spot Scanner 310

  • Ultra-fast scanner for short cycle times
  • No additional axis or precision hardware needed
  • Measures in a single scan bow, warp, TTV & quality inspection of wafers 

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Flying Spot Scanner 310 and CHRocodile 2 IT measuring a 12 inch wafer in a single scan

Flying Spot Scanner

  • Replaces X-Y motion system
  • Set up your own scanning path for any kind of material
  • Saves time and money

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CHRocodile 2 IT precise and fast thickness measurements

  • Ultra-fast
  • Wide measuring range
  • Excellent on differing surfaces
  • Exactly the right probe for your needs

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Product details CHRocodile 2 IT

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