NEMESIS WT
Chromatic Nemesis WT Measuring System

The Nemesis WT measuring unit made by Precitec Optronik, Rodgau, Germany now offers a simple way of measuring samples of very thin materials such as SiC wafers and similar materials.

The system is designed for detecting thickness and topography of both transparent and opaque materials of highly sensitive products simultaneously. This is a non-contact system eliminating any damage to the surface allowing samples to be returned as sellable product.

NEMESIS WT

The new unit works with the chromatic white light sensors of the new CHRocodile product family from Precitec Optronik.

Data sheets (Optical 3D-Measuring Systems) in PDF format for downloading and printing. Use the Product Information form to request a prospectus.

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